Extended Depth of Field (EDF) vs. Higher Magnification: Which Improves Inspection Accuracy?
Introduction When selecting a microscope for electronics inspection, semiconductor analysis, or precision manufacturing, one of the most common questions engineers ask is: “Should we choose higher magnification or Extended Depth of Field (EDF) technology to improve inspection accuracy?” At first glance, higher magnification seems like the obvious answer. A larger image appears to reveal more […]