How to Choose a Coaxial Light Microscope for Semiconductor Wafer Inspection
Introduction Semiconductor wafer inspection requires more than magnification. Surface reflectivity, micro-defect visibility, illumination consistency, and imaging accuracy all affect inspection quality. Wafers often contain polished, highly reflective surfaces that make scratches, contamination, and fine edge defects difficult to detect under standard lighting. That is why many engineers rely on coaxial illumination microscopes to improve image […]