Semiconductor Microscope Lighting Guide: How to Choose the Right Illumination for Wafer, Chip & IC Inspection
Introduction In semiconductor inspection, image quality depends on more than magnification. Even with a high-resolution objective and a quality camera, poor illumination can hide scratches, reduce contrast, and make surface contamination difficult to detect. For wafer fabs, electronics manufacturers, and engineering teams responsible for defect analysis, microscope lighting often determines whether a defect is clearly […]